Data-driven Methods for Fault Localization in Process Technology

• Autore: Kühnert Christian
• Pubblicazione: KIT Scientific Publishing, 2013
• Descrizione fisica: 1 electronic resource (XVIII, 194 p. p.)
• Soggetto non controllato: Time series; Signal processing; Data Mining; System identification; Causality
• Sommario/riassunto: Control systems at production plants consist of a large number of process variables. When detecting abnormal behavior, these variables generate an alarm. Due to the interconnection of the plant's devices the fault can lead to an alarm flood. This again hides the original location of the causing device. In this work several data-driven approaches for root cause localization are proposed, compared and combined. All methods analyze disturbed process data for backtracking the propagation path.
• Titolo autorizzato: Data-driven Methods for Fault Localization in Process Technology
• ISBN: 1000036427
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910347060203321
• Lo trovi qui: Univ. Federico II